A63.7081 Schottky Field Emission Gun Scanning Electron Microscope Pro FEG SEM, 15x ~ 800000x
Sharaxaadda alaabta
A63.7081 Schottky Qoriga Siidaynta Goobta Microscope elektaroonig ah Pro FEG SEM | ||
Qaraarka | 1nm @ 30KV (SE); 3nm @ 1KV (SE); 2.5nm@30KV (BSE) | |
Weyneynta | 15x ~ 800000x | |
Qoriga Elektarooniga ah | Schottky Emission Electron Gun | |
Elektaroonigga Beam Current | 10pA ~ 0.3μA | |
Dardargelinta Safarka | 0 ~ 30KV | |
Nidaamka Vacuum | 2 Ion Bambooyin, Turbo Molecular Mashiinka, Bamamka Farsamada | |
Baare | SE: Qalabka Vetoum Secondary Electron Detector (oo leh Ilaalin Baadhe) | |
BSE: Semiconductor Afaraad Qaybaha Kala-baxa Kala-Bixinta | ||
CCD | ||
Heerka Saamiga | Shanta Wado Eucentric Gawaarida Gawaarida | |
Safarka Safarka | X | 0 ~ 150mm |
Y | 0 ~ 150mm | |
Z | 0 ~ 60mm | |
R | 360º | |
T | -5º ~ 75º | |
Ballaca Xajmiga Max | 320mm | |
Wax ka beddelka | EBL; STM; AFM; Heerkulka kululaynta; Cryo Stage; Heerka siligsanaanta | |
Qalabka | X-Ray Baadhe (EDS), EBSD, CL, WDS, Mashiinka Dahaarka Iwm. |
Faa'iidada iyo Kiisaska
Baadhitaanka elektaroonigga elektaroonigga ah (sem) wuxuu ku habboon yahay ka fiirsashada muuqaalka dusha sare ee biraha, dhoobada, semiconductors, macdanta, bayoolajiga, polymerka, iskudhafyada iyo nano-cabirka hal-cabbir, laba-cabbir iyo saddex-cabbir Waxaa loo isticmaali karaa in lagu falanqeeyo barta, khadka iyo qaybaha dusha sare ee microregion.Waxaa si ballaaran loogu isticmaalaa batroolka, cilmiga geology, dhulka macdanta, elektaroniga, qeybta semiconductor, daawada, cilmiga bayoolajiga, warshadaha kiimikada, maadada polymer, baaritaanka dambiyada ee amniga guud, beeraha, keymaha iyo beeraha kale. |
Macluumaadka Shirkadda
Halkan ku qor fariintaada oo noo soo dir