A63.7069 Tungsten Filament Scanning Electron Microscope, Xeeb SEM, 6x ~ 600000x

A63.7069 Tungsten Filament Scanning Electron Microscope, Std. SEM, 6x~600000x Featured Image

Sharax Gaaban:

6x ~ 60000x Tungsten Filament Scanning Elektaroonik, Std. SEM
Dib u cusbooneysiin LaB6, X-Ray Detector, EBSD, CL, WDS, Mashiinka Dahaarka iyo Iwm.
Isbeddello Badan EBL, STM, AFTM, Heatign Stage, Cryo Stage, Tensile Stage, SEM + Laser Iyo IWM
Gawaarida otomaatiga ah, ogaanshaha cillad otomaatiga ah, Qiimaha jaban ee Joogtada & Dayactirka
Isdhaafsiga Hawlgalka Si Fudud & Saaxiibtinimo Leh, Dhammaanna Lagu Wariyey Mouse In Nidaamka Windows
Tirada ugu yar:1

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A63.7069_01.jpg

Sharaxaadda alaabta

A63.7069 Tungsten Filament Microscope elektaroonig ah, Std. SEM
Qaraarka		3nm @ 30KV (SE); 6nm @ 30KV (BSE)
Weyneeya		Magnification xun: 6x ~ 300000x; Magnigga Shaashadda: 12x ~ 600000x
Qoriga Elektarooniga ah		Tungsten Heat Cathode-Pre Centered Tungsten Filament Cartridge (Kaydinta)
Dardargelinta Danab		0 ~ 30KV
Nidaamka Lens		Lens Elektagagnetic Seddex-heer ah (Lens Taabasho)
Furitaanka ujeeddada		Furitaanka Molybdenum Nidaamka Faakuumka Dibadda
Heerka Saamiga		Marxaladda shan geesood
Safarka Safarka	X (Gawaarida)	0 ~ 80mm
	Y (Awood)	0 ~ 60mm
	Z (Buug)	0 ~ 50mm
	R (Buug)	360º
	T (Buug)	-5º ~ 90º
Ballaca Xajmiga Max		175mm
Baare		SE: Qalabka Vetoum Secondary Electron Detector (oo leh ilaaliyaha baaraha)
		BSE: Semiconductor Afaraad Qaybaha Kala-baxa Kala-Bixinta
		CCD
Wax ka beddelka		Marxaladda kor loo qaadayo; EBL; STM; AFM; Heerkulka kululaynta; Marxaladda Cryo; Marxaladda Feejignaanta; Manipulator Micro-nano; SEM + Mashiinka Dahaarka; SEM + Laser
Qalabka		CCD, LaB6, X-Ray Detector (EDS), EBSD, CL, WDS, Mashiinka Daahan
Nidaamka Vacuum		Bambooyin Molecular Turbo ah
Elektaroonigga Beam Current		10pA ~ 0.1μA
PC		Saldhigga Shaqada ee Dell

Faa'iidada iyo Kiisaska

Baadhitaanka elektaroonigga elektaroonigga ah (sem) wuxuu ku habboon yahay ka fiirsashada muuqaalka dusha sare ee biraha, dhoobada, semiconductors, macdanta, bayoolajiga, polymerka, iskudhafyada iyo nano-cabirka hal-cabbir, laba-cabbir iyo saddex-cabbir Waxaa loo isticmaali karaa in lagu falanqeeyo barta, khadka iyo qaybaha dusha sare ee microregion.Waxaa si ballaaran loogu isticmaalaa batroolka, cilmiga geology, dhulka macdanta, elektaroniga, qeybta semiconductor, daawada, cilmiga bayoolajiga, warshadaha kiimikada, maadada polymer, baaritaanka dambiyada ee amniga guud, beeraha, keymaha iyo beeraha kale.

Macluumaadka Shirkadda

OPTO-EDU, oo ah mid ka mid ah soosaarayaasha ugu xirfada badan iyo soo saare ee mikroskoobka ee Shiinaha, nooc-hoosaadkeena CNOPTEC taxanaha dhamaadka bayoolaji sare, shaybaarka, kala-beddelka, metalliga, mikroskoobyada fluorescene, microscope taxane CNCOMPARISON, A63 taxane SEM microscope, iyo .49 taxane kamarad dijitaal ah, kamarad LCD ah ayaa caan ka ah suuqa adduunka.